STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
نویسندگان
چکیده
منابع مشابه
Atomic Column Elemental Mapping by STEM-Moiré Method
Atomic column elemental mapping is realized by electron energy loss spectroscopy (EELS) and/or energy dispersive X-ray spectroscopy (EDS) [1], with modern technologies of electron microscopy such as an aberration corrector [2]. The method is widely utilized in materials and physical sciences, since atomic species and positions in a crystalline specimen can be determined directly. A crucial issu...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2015
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927615002494